Check our new CMRR materials characterization facility

Check our new CMRR materials characterization facility


CMRR Materials Characterization Facility 

The facility provides access to an array of state-of-the-art equipment for nanomaterial (both thin-film and powder) characterization, including XRD, XPS, Hall effect, UV-Vis, AFM/MFM, SEM, and photocurrent systems to measure crystal structure, and magnetic, surface, transport, and optical properties. 

  • Hitachi UH4150 UV-Visible/NIR Spectrophotometer (Xiujun Yue)
  • JEOL JSM-7400F Field Emission Scanning Electron Microscope (TBD)
  • Kobelco Photocurrent Measurement System (Kenji Nomura)
  • Lake Shore 8400 Series Hall Effect Measurement System (Mohammed El Hadri)
  • Panalytical XPert XRD - Line Source (Yasuhiro Kodera)
  • Panalytical XPert XRD - Point Source (Yasuhiro Kodera)
  • PHI Quantera Scanning XPS (Yixuan Li)
  • Bruker D2 Phaser Benchtop XRD (TBD)
  • Rigaku Smartlab XRD (Hayley Hirsh)
  • Veeco Dimension 3100 AFM/MFM (Jeffrey Brock)

For any questions, please contact Octavio Ochoa, CMRR Business Officer. 

Rigaku SmartLab XRD