CMRR Materials Characterization Facility 

The facility provides access to an array of state-of-the-art equipment for nanomaterial (both thin-film and powder) characterization, including XRD, XPS, Hall effect, UV-Vis, AFM/MFM, SEM, and photocurrent systems to measure crystal structure, and magnetic, surface, transport, and optical properties. 

• Hitachi UH4150 UV-Visible/NIR Spectrophotometer (Xiujun Yue)
• JEOL JSM-7400F Field Emission Scanning Electron Microscope (TBD)
• Kobelco Photocurrent Measurement System (Kenji Nomura)
• Lake Shore 8400 Series Hall Effect Measurement System (Mohammed El Hadri)
• Panalytical XPert XRD - Line Source (Yasuhiro Kodera)
• Panalytical XPert XRD - Point Source (Yasuhiro Kodera)
• PHI Quantera Scanning XPS (Yixuan Li)
• Bruker D2 Phaser Benchtop XRD (TBD)
• Rigaku Smartlab XRD (Hayley Hirsh)
• Veeco Dimension 3100 AFM/MFM (Jeffrey Brock)

For any questions, please contact Octavio Ochoa, CMRR Business Officer.